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http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454
Title: | The development of a goodness-of-fit test for high level binary multilevel models. |
Authors: | Fernando, G. Sooriyarachchi, M.R. |
Keywords: | Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation |
Issue Date: | 2020 |
Publisher: | Taylor and Francis |
Citation: | Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275 |
Abstract: | Before making inferences about a population using a fitted model, it is necessary to determine whether the fitted model describes the data well. A poorly fitted model may lead to biased and invalid conclusions, resulting in incorrect inferences. Recent studies show the necessity of goodness-of-fit tests for high level binary multilevel models. The focus here was to develop a goodness-of-fit test to use in the model adequacy testing of high level binary multilevel models and to examine, whether the type I error and power hold for the newly developed goodness-of-fit test considering a three-level random intercept model. |
URI: | http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454 |
Appears in Collections: | Department of Statistics |
Files in This Item:
File | Description | Size | Format | |
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Published.pdf | 1.69 MB | Adobe PDF | View/Open |
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